Charge trapping non-volatile memory and method for gate-by-gate erase for same

ABSTRACT

A multiple-gate memory cell comprises a semiconductor body and a plurality of gates arranged in series on the semiconductor body. A charge storage structure on the semiconductor body includes charge trapping locations beneath gates in the plurality of gates. Circuitry to conduct source and drain bias voltages to the semiconductor body near a first gate and a last gate in the series, and circuitry to conduct gate bias voltages to the plurality of gates are included. The multiple-gate memory cell includes a continuous, multiple-gate channel region beneath the plurality of gates in the series, with charge storage locations between some or all of the gates.

RELATED APPLICATIONS

This application claims the benefit of U.S. Provisional Application Ser.No. 60/585,658 filed 6 Jul. 2004; and of U.S. Provisional ApplicationSer. No. 60/585,657 filed 6 Jul. 2004.

BACKGROUND OF THE INVENTION

1. Field of the Invention

The present invention relates to integrated circuit non-volatile memorydevices, and more particularly to a novel memory cell and operatingmethod for such device.

2. Description of Related Art

Electrically programmable and erasable non-volatile memory technologiesknown as EEPROM and flash memory based on charge storage are used in avariety of modem applications. A number of memory cell structures areused for EEPROM and flash memory. As the dimensions of integratedcircuits shrink, greater interest is arising in memory cell structuresbased on charge trapping dielectric layers, because of the scalabilityand simplicity of the manufacturing processes. Memory cell structuresbased on charge trapping dielectric layers include structures known bythe industry names NROM, SONOS, MONOS and PHINES, for example. Thesememory cell structures store data by trapping charge in a chargetrapping dielectric layer, such as silicon nitride. As negative chargeis trapped, the threshold voltage of the memory cell increases. Thethreshold voltage of the memory cell is reduced by removing negativecharge from the charge trapping layer.

FIG. 1 is a simplified diagram of a prior art SONOS-type charge trappingmemory cell. The substrate includes n⁺-doped regions that act as sourceand drain terminals 15 and 16, and a p-doped channel region 17 betweenthe terminals 15 and 16. The remainder of the memory cell includes acharge trapping structure including bottom dielectric 14 on thesubstrate, a charge trapping material 13 on the bottom dielectric 14, atop dielectric 12 on the charge trapping material 13, and a gate 11 onthe top dielectric 12. Representative top dielectrics include silicondioxide and silicon oxynitride having a thickness of about 5 to 10nanometers, or other similar high dielectric constant materialsincluding for example Al₂O₃. Representative bottom dielectrics includesilicon dioxide and silicon oxynitride having a thickness of about 3 to10 nanometers, or other similar high dielectric constant materials.Representative charge trapping materials for this type of chargetrapping structure include silicon nitride having a thickness of about 3to 9 nanometers, or other similar high dielectric constant materials,including silicon oxynitride, metal oxides such as Al₂O₃, HfO₂, andothers. The charge trapping material may be a discontinuous set ofpockets or particles of charge trapping material, or a continuous layeras shown in the drawings.

The terminals 15, 16 for the memory cell act as source and drain in thebias arrangements used for reading, programming and erasing the memorycells. The doped regions, forming terminals 15, 16, typically compriseimpurities that are implanted into the semiconductor substrate toestablish conductive terminals having a conductivity type which is theopposite of that in the channel region 17. The procedures for implantingthe impurities that result in diffusion of the implanted impurities intothe semiconductor substrate can limit the ability to shrink the lengthof the channel between the terminals 15 and 16, even as the minimumdimensions achievable using lithography shrink.

FIG. 2A and FIG. 2B illustrate one bias arrangement in the prior artthat induces Fowler-Nordheim tunneling from the substrate into thecharge trapping structure, for programming a memory cell to a highthreshold state. FIG. 2A is a table showing the bias voltages on thegate Vg, source Vs, drain Vd and substrate Vb, which result in electrontunneling as illustrated in FIG. 2B, according to this prior artarrangement.

FIG. 3 shows prior art SONOS-type cells arranged in series for aNAND-type array structure, with a bias arrangement illustrated forprogramming a selected cell. The series of cells in FIG. 3 comprises n⁺doped regions 20–26, select gates SLG1 and SLG2, and word lines WL₁–WL₄.Charge storage structures 27–30 are provided beneath the word linesWL₁–WL₄, and over channel regions 31–34 between the doped regions 21 and22, doped regions 22 and 23, doped regions 23 and 24, and doped regions24 and 25 respectively. Doped regions 20 and 26 act as bit lines orcontacts for bit lines BL₁ and BL₂, respectively. The select transistorsformed by the select gates SLG1 and SLG2, doped regions 20 and 21, anddoped regions 25 and 26, respectively, act to connect the series ofmemory cells to, or isolate the series of memory cells from, the bitlines BL₁ and BL₂. In order to program a selected memory cell in theseries, such as the memory cell at WL₁, a bias arrangement is applied asillustrated in which BL₁ is coupled either to ground (to program theselected cell by FN injection) or to a supply potential Vcc (to inhibitprogramming of the selected cell). The select gate SLG1 receives thesupply potential Vcc in order to couple the bit line BL₁ to the dopedregion 21. The select gate SLG2 receives zero volts or ground in orderto isolate the bit line BL₂ from the doped region 25. The word line ofthe selected cell, WL₁ in this example, receives a high-voltage of about18V, while the substrate is grounded. The word lines of unselected cellsreceive a voltage of about 10V, which is sufficient to induce inversionin their respective channel regions, but insufficient to causesignificant charge injection. As shown in FIG. 3, a doped region isformed between each channel region.

Thus, one limitation on the size of traditional memory cells arises fromthe use of diffusion lines in semiconductor substrates for source anddrain terminals. The diffusion of impurities used to form the diffusionlines spreads out beyond the locations in which the implant is made,increasing the size of the doped region and causing other limitations oncell size, including minimum channel lengths for prevention ofpunch-through.

One approach to overcoming the problems with use of diffusion lines hasbeen developed based on inducing conductive inversion regions in thesubstrate using control electrodes adjacent to the charge storagestructure in the memory cell, so that the dynamically establishedinversion regions act as source and drain terminals. Because there areno implants, the dimensions of the inversion regions can be moreprecisely controlled according to the minimum feature sizes of themanufacturing process. See, Sasago et al., “90-nm-node multi-levelAG-AND type flash memory with cell size of true 2F²/bit and programmingthroughput of 10 MB/s,” IEDM, 2003, pages 823–826 and United StatesPatent Application Publication No. US 2004/0084714 by Ishii et al. Theassist gate technique of Sasago et al. might be considered an extensionof so called “split gate” technology applied to floating gate memorydevices in a variety of forms. See, U.S. Pat. No. 5,408,115 by Chang forbackground related to split gate devices.

It is desirable to provide memory technology for nonvolatile memory thatis easily manufactured and supports high-density applications.

SUMMARY OF THE INVENTION

An integrated circuit memory device based on multiple-gate memory cellsis described. An embodiment of such a device comprises a semiconductorbody and a plurality of gates arranged in series on the semiconductorbody. A charge storage structure on the semiconductor body includescharge trapping locations beneath more than one of the gates in theplurality of gates. Circuitry to conduct source and drain bias voltagesto first and second terminal locations in the semiconductor body near afirst gate and a last gate, respectively, in the series, and circuitryto conduct gate bias voltages to the plurality of gates are included.The multiple-gate memory cell includes a continuous, multiple-gatechannel region beneath the plurality of gates in the series, between thefirst and second terminal locations. In some embodiments, chargetrapping locations are included beneath all of the gates in the seriesfor a given multiple-gate memory cell, and all the gates are used ascontrol gates for storage of data. In other embodiments, not all thegates in the series are used as control gates for storage of data. Inone example, every other gate is used for a control gate for storage ofdata, while the other gates in the series are used to improve isolationbetween the storage locations in the memory cells.

In embodiments on the multiple-gate memory cell, data is stored in twolocations beneath more than one, or all, of the gates in the pluralityof gates in the series, whereby two storage locations are used percontrol gate for storage of data.

In embodiments, the circuitry to conduct source and drain bias voltagescomprises conductive material arranged as bit lines, and the circuitryto conduct gate bias voltages comprises conductive material arranged asword lines. For example, first and second doped regions are included inthe semiconductor body to provide terminal locations adjacent the firstgate in the series and adjacent the last gate in the series. The dopedregions have a conductivity type opposite that of the semiconductor bodyand act as source and drain terminals. In other embodiments, the firstand second terminal locations are provided by inversion regions inducedin the substrate during access to the storage locations in themultiple-gate memory cell. A device, such as a select transistor, isincluded in some embodiments to selectively connect the doped regions orinversion regions which act as at least one of the first and secondterminal locations to bit lines.

Integrated circuit devices including multiple-gate memory cells can beimplemented with controllers that control the circuitry to conductsource and drain bias voltages and the circuitry to conduct gate biasvoltages, in order to establish bias arrangements for operating of thememory cell. Bias arrangements provided by the controller, in oneexample, include a program bias arrangement to induce electron injectiontunneling into the charge trapping location beneath a selected gate inthe series on the cell for establishing a high threshold state. Duringprogramming, selected gate bias voltages are applied to another controlgate, or all other control gates, in the series sufficient to induceinversion in the channel region to support the electron tunneling. Biasarrangements provided by the controller, in examples includingprogramming by electron injection include an erase bias arrangement toinduce electron ejection or hole injection into the charge storagelocations being erased, to establish a low threshold state.

In embodiments of integrated circuits including the multiple-gate memorycell, including embodiments utilizing two storage locations per controlgate, a controller controls the circuitry to conduct source and drainbias voltages and the circuitry to conduct gate bias voltages toestablish a bias arrangement for storing data in charge trappinglocations beneath each of more than one of the plurality of gates in theseries. Bias arrangements provided by the controller, in one example,include a program bias arrangement to induce hot hole injectiontunneling into the charge trapping location in a selected one of the twocharge storage locations beneath a selected gate in the series on thecell for establishing a low threshold state. During programming of aselected charge storage location beneath a selected control gate, biasvoltages are applied to another gate, or all other gates, in the seriessufficient to induce inversion in the channel region to support the holetunneling. Bias arrangements provided by the controller, in examplesincluding programming by hole injection, include an erase biasarrangement to induce electron injection into the charge storagelocations being erased, to establish a high threshold state. Inembodiments of integrated circuits including the multiple-gate memorycell, including embodiments utilizing two storage locations per controlgate, a controller applies bias arrangements for erase, including hothole erase in some embodiments, according to an erase procedureincluding erasing a storage location beneath a selected gate in theseries in the multiple-gate memory cell, while not erasing a storagelocation beneath another gate in the series.

Bias arrangements provided by the controller, in some examples, includea read bias arrangement under which a selected control gate receives aread voltage, and the control gates over other storage locations receivea voltage to induce inversion in the multiple-gate channel region tosupport reading of the selected memory location.

A method for operating an integrated circuit memory device is alsodescribed, where the device comprises a multiple-gate memory cell asdescribed above, and where the method is typically controlled by anon-chip controller. The method comprises applying a bias arrangement forreading data at a location beneath a selected gate, a bias arrangementfor programming data at a location beneath a selected gate and a biasarrangement for erasing the data in the device. In embodiments of themethod, the bias arrangement for programming includes:

-   -   applying a substrate bias condition to the semiconductor body in        the multiple-gate channel region;    -   applying a source bias condition to the semiconductor body near        one of the first and last gates in the series;    -   applying a drain bias condition to the semiconductor body near        another of the first and last gates in the series; and    -   applying gate bias conditions to the plurality of gates in the        series, wherein the gate bias conditions include a program        voltage relative to the substrate bias condition on a selected        gate in the series sufficient to induce electron injection        current into a charge trapping location beneath the selected        gate to establish a high threshold state, and inversion voltages        on other gates in the series sufficient to induce inversion in        the multiple-gate channel region beneath said other gates        without significant electron injection into charge storage        locations beneath said other gates.

In embodiments of the method, the bias arrangement for erasing includes:

-   -   applying a substrate bias condition to the semiconductor body in        the multiple-gate channel region;    -   applying a source bias condition to the semiconductor body near        one of the first and last gates in the series;    -   applying a drain bias condition to the semiconductor body near        another of the first and last gates in the series; and    -   applying gate bias conditions to the plurality of gates in the        series, wherein the gate bias conditions include voltages        sufficient to induce electron ejection or hole injection, from        the charge trapping locations beneath the gates in the series to        establish the low threshold state.

In another example, the bias arrangement for erasing includes:

-   -   applying a substrate bias condition to the semiconductor body in        the multiple-gate channel region;    -   applying a source bias condition to the semiconductor body near        one of the first and last gates in the series;    -   applying a drain bias condition to the semiconductor body near        another of the first and last gates in the series; and    -   applying gate bias conditions for erasing one or more selected        locations beneath the plurality of gates in the series, wherein        the gate bias conditions include voltages sufficient to induce        hole injection to the charge trapping locations beneath a        selected gate in the series and inversion voltages on other        gates in the series sufficient to induce inversion in the        multiple-gate channel region beneath said other gates, to        establish a low threshold state in the selected gate.

Erase procedures according to embodiments of the method, include

-   -   identifying a set of gates in the plurality of gates in the        series to be erased, the set of gates having more than one        member;    -   applying said gate bias conditions for erase for a first        selected gate in the set of gates to induce one or both of        source side and drain side band-to-band tunneling-induced hot        hole injection to the charge storage location beneath the first        selected gate; and    -   applying said gate bias conditions for erase for a next selected        gate in the set of gates to induce one or both of source side        and drain side band-to-band tunneling-induced hot hole injection        to the charge storage location beneath the next selected gate,        and repeating until applying said gate bias conditions for erase        to all the gates in the set.

In embodiments of the method, the bias arrangement for reading todetermine data represented by high and low threshold states, includes:

-   -   applying a substrate bias condition to the semiconductor body in        the multiple-gate channel region;    -   applying a source bias condition to the semiconductor body near        one of the first and last gates in the series;    -   applying a drain bias condition to the semiconductor body near        another of the first and last gates in the series; and    -   applying gate bias conditions to the plurality of gates in the        series, wherein the gate bias conditions include a read voltage        relative to the substrate bias condition on a selected gate in        the series, the read voltage being higher than a threshold        voltage for the low threshold state, and inversion voltages on        other gates in the series sufficient to induce inversion in the        multiple-gate channel region beneath said other gates, the        inversion voltages higher than the high threshold state.

Multiple gate memory cells as described herein are arranged in arraysincluding a plurality of word lines coupled to the plurality of gates ofmultiple-gate memory cells in at least one row; a plurality of bitlines, arranged orthogonally to the plurality of word lines, andarranged for connection to multiple-gate memory cells in one or morecolumns of the plurality of columns; a plurality of select gatesarranged to connect respective multiple-gate memory cells in the atleast one row to a corresponding bit line in the plurality of bit linesin response to a select gate control signal; and a select line coupledto the plurality of select gates in the at least one row to provide theselect gate control signal. In addition, a controller controls theplurality of bit lines, plurality of word lines and the select line toconduct source and drain bias voltages to the multiple-gate memory cellsin the array, and to conduct gate bias voltages to the plurality ofgates in the multiple-gate memory cells in the at least one row, and toprovide the select gate control signal.

Multiple-gate memory cells and arrays of multiple-gate memory cells asdescribed herein are manufactured according to methods, in someembodiments, including

-   -   providing a semiconductor body having a first conductivity type;    -   forming a charge storage structure on the semiconductor body;    -   depositing a first gate conductor layer over the charge storage        structure;    -   patterning the first gate conductor layer to define a first        plurality of gates over the charge storage structure, the first        plurality of gates arranged in series with spaces between them        over a continuous, multiple-gate channel region between a first        terminal location and a second terminal location in the        semiconductor body;    -   forming an isolation layer of material on at least sidewalls of        the first plurality of gates;    -   depositing a second gate conductor layer over the isolation        layer, including in the spaces between the first plurality of        gates, and isolated from the first plurality of gates by the        isolation layer; to define a second plurality of gates over the        semiconductor body, the first plurality of gates and the second        plurality of gates arranged in series over the continuous,        multiple-gate channel region between the first terminal location        and the second terminal location in the semiconductor body to        form a multiple-gate memory cell.

In embodiments of the multiple-gate memory cells described herein, thegates in the series are separated from one another by small distances,set for examples manufactured as described in the previous paragraph, bya thickness of the isolation layer on the sidewalls of the controlgates. Such distances are substantially less than the gate lengths inthe continuous multiple-gate channel, for the individual gates,including distances less than 100 nanometers.

Other aspects and advantages of the present invention can be seen onreview of the drawings, the detailed description and the claims, whichfollow.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 is a diagram of a prior art charge trapping memory cell.

FIGS. 2A and 2B illustrate a bias arrangement for programming a priorart charge trapping memory cell by inducing FN tunneling.

FIG. 3 illustrates a prior art arrangement of a series of chargetrapping memory cells, in a series NAND configuration, with a biasarrangement for programming a selected cell in the series.

FIG. 4 illustrates a multiple-gate memory cell, having two controlgates.

FIG. 5 is a schematic symbol for a multiple-gate memory cell like thatof FIG. 4.

FIG. 6 illustrates a multiple-gate memory cell, having two control gatesin series, with a bias arrangement for programming a storage locationbeneath a selected cell in the series.

FIGS. 7A–7D show a multiple-gate memory cell, having two control gatesin series, with respective bias arrangements for reading a storagelocation beneath a selected cell in the series.

FIG. 8 illustrates a multiple-gate memory cell, having two control gatesin series, with a bias arrangement for erasing a storage locationbeneath a selected cell in the series.

FIG. 9 illustrates a multiple-gate memory cell, having two control gatesin series, with an alternative bias arrangement for erasing a storagelocation beneath a selected cell in the series.

FIG. 10 illustrates a multiple-gate memory cell, having N control gates.

FIG. 11 is a schematic symbol for a multiple-gate memory cell like thatof FIG. 4.

FIG. 12 illustrates a multiple-gate memory cell, having N control gatesin series, with a bias arrangement for programming a storage locationbeneath a selected cell in the series.

FIG. 13 shows a multiple-gate memory cell, having N control gates inseries, with a bias arrangement for reading a storage location beneath aselected cell in the series.

FIG. 14 shows a multiple-gate memory cell, having N control gates inseries, with a bias arrangement for erasing a storage location beneath aselected cell in the series.

FIG. 15 shows a multiple-gate memory cell, having N control gates inseries, with an alternative bias arrangement for erasing a storagelocation beneath a selected cell in the series.

FIG. 16 is a simplified flow chart of an erasing procedure, applying thebias arrangement of FIG. 14 or FIG. 15.

FIG. 17 shows a multiple-gate memory cell, having N control gates inseries, with circuitry for conducting source and drain voltages to thesemiconductor body near first and last gates in the series.

FIG. 18 shows a multiple-gate memory cell, having N control gates inseries, with select gate transistors for conducting source and drainvoltages to the semiconductor body near first and last gates in theseries.

FIG. 19 shows a multiple-gate memory cell, having N control gates inseries, with an alternative implementation for select gates forconducting source and drain voltages to the semiconductor body nearfirst and last gates in the series.

FIG. 20 shows a multiple-gate memory cell, having N control gates inseries, with another alternative implementation for select gates forconducting source and drain voltages to the semiconductor body nearfirst and last gates in the series.

FIG. 21 shows a multiple-gate memory cell, having N control gates inseries, with alternative implementation circuitry for conducting sourceand drain voltages to the semiconductor body near first and last gatesin the series.

FIG. 22 shows a multiple-gate memory cell, having an odd number N+1 ofcontrol gates in series, with even numbered gates in the series actingas control gates for storage of data.

FIG. 23 shows a multiple-gate memory cell, having an odd number N+1 ofcontrol gates in series, with odd numbered gates in the series acting ascontrol gates for storage of data.

FIGS. 24A–24F illustrate a process for manufacturing a multiple-gatememory cell.

FIG. 25 illustrates a step in a process for manufacturing amultiple-gate memory cell, like the process of FIGS. 24A–24F, where thesource and drain implants are made through the charge storage structure.

FIGS. 26A–26D illustrate steps of a process for manufacturing amultiple-gate memory cell, like the multiple-gate memory cell of FIG. 22or FIG. 23.

FIG. 27 is a block diagram of an integrated circuit including an arrayof multiple-gate memory cells.

FIG. 28 illustrates a multiple-gate memory cell, having two controlgates and two storage locations associated with each control gate.

FIG. 29 illustrates a multiple-gate memory cell, having two controlgates and two storage locations associated with each control gate, witha bias arrangement for erasing the data under a selected control gate.

FIG. 30 illustrates a multiple-gate memory cell, having two controlgates and two storage locations associated with each control gate, withan alternative bias arrangement for erasing the data under a selectedcontrol gate.

FIG. 31 illustrates a multiple-gate memory cell, having two controlgates and two storage locations associated with each control gate, witha bias arrangement for programming the left side bit 1-1 beneath thefirst control gate.

FIG. 32 illustrates a multiple-gate memory cell, having two controlgates and two storage locations associated with each control gate, witha bias arrangement for programming the right side bit 1-2 beneath thefirst control gate.

FIG. 33 illustrates a multiple-gate memory cell, having two controlgates and two storage locations associated with each control gate, witha bias arrangement for programming the left side bit 2-1 beneath thesecond control gate.

FIG. 34 illustrates a multiple-gate memory cell, having two controlgates and two storage locations associated with each control gate, witha bias arrangement for programming the right side bit 2-2 beneath thesecond control gate.

FIG. 35 illustrates a multiple-gate memory cell, having two controlgates and two storage locations associated with each control gate, witha bias arrangement for reading the left side bit 1-1 beneath the firstcontrol gate.

FIG. 36 illustrates a multiple-gate memory cell, having two controlgates and two storage locations associated with each control gate, witha bias arrangement for reading the right side bit 1-2 beneath the firstcontrol gate.

FIG. 37 illustrates a multiple-gate memory cell, having two controlgates and two storage locations associated with each control gate, witha bias arrangement for reading the left side bit 2-1 beneath the secondcontrol gate.

FIG. 38 illustrates a multiple-gate memory cell, having two controlgates and two storage locations associated with each control gate, witha bias arrangement for reading the right side bit 2-2 beneath the secondcontrol gate.

FIG. 39 illustrates a multiple-gate memory cell, having N control gatesand two storage locations associated with each control gate.

FIG. 40 illustrates a multiple-gate memory cell, having N control gatesand two storage locations associated with each control gate, with a biasarrangement for erasing the data under selected control gates.

FIG. 41 illustrates a multiple-gate memory cell, having N control gatesand two storage locations associated with each control gate, with analternative bias arrangement for erasing the data under selected controlgates.

FIG. 42 illustrates a multiple-gate memory cell, having N control gatesand two storage locations associated with each control gate, with a biasarrangement for programming a left side bit beneath a selected controlgate.

FIG. 43 illustrates a multiple-gate memory cell, having N control gatesand two storage locations associated with each control gate, with a biasarrangement for programming the right side bit beneath a selectedcontrol gate.

FIG. 44 illustrates a multiple-gate memory cell, having N control gatesand two storage locations associated with each control gate, with a biasarrangement for reading a left side bit beneath a selected control gate.

FIG. 45 illustrates a multiple-gate memory cell, having N control gatesand two storage locations associated with each control gate, with a biasarrangement for reading the right side bit beneath a selected controlgate.

FIG. 46 is a schematic diagram of a layout for a sector of multiple-gatememory cells.

FIG. 47 is a schematic diagram of a first alternative layout for asector of multiple-gate memory cells.

FIG. 48 is a schematic diagram of a second alternative layout for asector of multiple-gate memory cells.

FIG. 49 is a schematic diagram of a third alternative layout for asector of multiple-gate memory cells.

FIG. 50 is a schematic diagram of a fourth alternative layout for asector of multiple-gate memory cells.

FIG. 51 illustrates a layout for a block of multiple-gate memory cells,including a plurality of sectors.

DETAILED DESCRIPTION

A detailed description of embodiments of the present invention isprovided with reference to the FIGS. 4–51.

As generally used herein, programming refers to setting the thresholdvoltage of selected memory locations bit-by-bit, and erasing refers tosetting the threshold voltage of a selected block of memory locations,or selected memory locations, to an “erase condition,” including flasherase of an entire array or sector of an array. Data is written inembodiments of the invention by a procedure including, first, an eraseprocess for a designated block to set the memory locations in the blockto an erase threshold, which is typically one of a high or low thresholdstate, followed by a program process for memory locations in the blockto set the selected memory locations to the program state, which istypically the other of the high or low threshold states, while leavingthe unselected memory locations in the block in the erase state.Embodiments of the technology described herein include both products andmethods where programming refers to raising the threshold voltage of amemory location and erasing refers to lowering the threshold voltage ofa memory location, and products and methods where programming refers tolowering the threshold voltage of a memory location and erasing refersto raising the threshold voltage of a memory location.

FIG. 4 illustrates a double gate memory cell according to the presentinvention, with a bias arrangement illustrated for programming aselected location. The double gate memory cell comprises terminals 55,56 formed by n⁺ doped regions at terminal locations on the left andright, respectively, left and right gates 50, 51 and channel region 58in the substrate 57. The doped regions serve as terminals 55, 56 toconnect the double gate memory cell to bit lines, or other circuitry tosupply bias voltages. The channel region 58 is a continuous p-typeregion in the substrate between the terminals 55 and 56, notably withouta doped region separating the segments of channel regions beneath theleft and right gates 50, 51. A charge storage structure including a topdielectric 52 such as silicon dioxide with a representative thickness ofabout 9 nm, a charge trapping layer 53, and a bottom dielectric 54 suchas silicon dioxide with a representative thickness of about 6 nm, isformed between the gates 50, 51 and the channel region 58 in a p-typesubstrate. The charge trapping layer 53 comprises a layer of materialsuch as silicon nitride about 6 nm thick, or other structure, that doesnot conduct trapped charge for a selected cell into regions that wouldsubstantially affect the threshold voltage of other locations in theseries. In some embodiments, the gates 50, 51 comprise n-type or p-typepolysilicon. Other representative gate materials include TiN, Pt, andother high work function metals and materials. Each of the storagelocations can store one bit, or multiple bits, of data. Multiple bitscan be stored for example in each location by establishing multipleprogram threshold levels for the locations.

FIG. 5 shows a schematic symbol of a double gate memory cell, like thatdescribed with reference to FIG. 4, where the source and draincorrespond with doped region terminals 55 and 56, respectively, andcontrol gate 1 corresponds with gate 50, and control gate 2 correspondswith gate 51.

FIG. 6 illustrates a bias arrangement for programming a selected memorylocation in a double gate memory cell, like that described withreference to FIG. 4. According to the bias arrangement, FN tunneling isinduced in the location represented by the electron symbols 60 in thecharge storage structure beneath gate 50, by grounding the substrate 57,applying Vg₁ of about 18 volts to gate 50, applying about 10 volts togate 51, while one of the doped region terminals 55 and 56 is groundedand the other is either grounded or left floating.

FIGS. 7A–7D illustrate bias arrangements for reading the data in adouble-gate memory cell, like that described with reference to FIG. 4.In FIG. 7A and FIG. 7B, the data, corresponding with “bit 1” of thedouble gate memory cell, stored in a charge storage location 70 beneaththe gate 50 receiving the gate voltage Vg₁, is read with either thesource side or the drain side receiving 2 volts. In FIG. 7C and FIG. 7D,the data corresponding with “bit 2” of the double gate memory cell,stored in a charge storage location 71 beneath the gate 51 receiving thegate voltage Vg₂, is read with either the source side or the drain sidereceiving 2 volts.

FIG. 7A illustrates the bias arrangement for reading “bit 1” in thestorage location 70 with terminal 56 acting as a drain with positive 2Volts applied, and terminal 55 acting as a source with ground applied.The gate voltage Vg₂ applied to gate 51 is high enough to cause aninversion 73 in the channel region between the terminals 55 and 56. Theinversion 73 induced by the gate voltage Vg₂ serves to couple thevoltage at the drain or the source to the region in the channel near thestorage location 70. The gate voltage Vg₁ applied to gate 50 is setabove the low threshold state for the memory cell, and below the highthreshold state. One example implementation applies a gate voltage Vg₁of about 2 volts. FIG. 7B illustrates reading the same “bit 1” in thestorage location 70 with a bias for terminal 56 and terminal 55reversed.

FIG. 7C illustrates the bias arrangement for reading “bit 2” in thestorage location 71 with terminal 56 acting as a drain with positive 2Volts applied, and terminal 55 acting as a source with ground applied.The gate voltage Vg₁ applied to gate 50 is high enough to cause aninversion 74 in the channel region between the terminals 55 and 56. Theinversion 74 induced by the gate voltage Vg₁ serves to couple thevoltage at the drain or the source to the region in the channel near thestorage location 71. The gate voltage Vg₂ applied to gate 51 is setabove the low threshold state for the memory cell, and below the highthreshold state. One example implementation applies a gate voltage Vg₂of about 2 Volts. FIG. 7D illustrates reading the same “bit 2” in thestorage location 71 with a bias for terminal 56 and terminal 55reversed.

FIGS. 8 and 9 illustrate alternative biasing arrangements for erasingdata in a memory cell like that of FIG. 4, operated with one bit percontrol gate in the multiple-gate cell, and which is suitable for use incombination with the programming bias arrangement of FIG. 6. Asillustrated in FIG. 8, an erasing bias arrangement for erasing “bit 1”in a storage location beneath the control gate 50 includes applying agate voltage Vg₁of about −5 Volts to gate 50, a gate voltage Vg₂ ofabout 10 volts to gate 51, while grounding the terminal 55 and applyingabout 5 volts to the terminal 56. This creates inversion region 75beneath the gate 51, and induces hot holes 76 in the substrate beneaththe gate 50. The hot holes are injected into the storage location of“bit 1,” displacing electrons and reducing the threshold voltage for thestorage location beneath the gate 50.

As illustrated in FIG. 9, an alternative erasing bias arrangement forerasing “bit 1” in a storage location beneath the control gate 50includes applying a gate voltage Vg₁ of about −5 Volts to gate 50, agate voltage Vg₂ of about 10 volts to gate 51, while grounding theterminal 56 and applying about 5 volts to the terminal 55. This createsinversion region 77 beneath the gate 51, and induces hot holes 78 in thesubstrate beneath the gate 50. The hot holes are injected into thestorage location of “bit 1,” displacing electrons and reducing thethreshold voltage for the storage location beneath the gate 50. In someembodiments, “bit 1” can be erased by applying first the biasingarrangement of FIG. 8, followed by the biasing arrangement of FIG. 9,which may tend to balance the charge distribution in the storagelocation.

FIG. 10 illustrates an embodiment in which there are more than two gatesin a multiple-gate memory cell, extending the embodiment illustrated inFIG. 4 to a number N of gates over a single continuous channel region ina substrate 100. The multiple-gate cell in FIG. 10 includes a firstterminal 101 and a second terminal 102 implemented by buried diffusionin the substrate 100. A plurality of control gates, 103-1 through 103-Noverlie a charge storage structure comprising top dielectric 105, chargetrapping layer 106, and bottom dielectric 107. Charge storage locations104-1 through 104-N within the charge trapping layer 106 overlie thesubstrate in the continuous channel region between the terminals 101 and102. As illustrated in the figure, a bias arrangement applies gatevoltages Vg₁ through Vg_(N) to the control gates 103-1 through 103-N, asource voltage Vs to terminal 101 and a drain voltage Vd to terminal102. Of course, the source and drain voltages could be applied inopposite manner to terminals 102 and 101, respectively.

The number N of control gates in a single, multiple-gate memory cell asillustrated in FIG. 10 can be selected as suits the needs of aparticular implementation. For example, in one embodiment N is equal to8. In other embodiments, N can be greater or smaller than 8.

FIG. 11 shows a schematic symbol of a multiple-gate structure, like thatdescribed with reference to FIG. 10, where the source and draincorrespond with terminals 101 and 102, respectively, and control gate 1corresponds with gate 103-1, and control gate N-corresponds with gate103-N.

FIG. 12 illustrates a bias arrangement for programming a selected memorylocation in a multiple-gate memory cell, like that described withreference to FIG. 10. According to the bias arrangement, FN tunneling isinduced in the location represented by the electron symbols 110 in thecharge storage structure beneath gate 103-2, by grounding the substrate100, applying Vg₂ of 18 volts to gate 103-2, applying about 10 volts togates 103-1 and 103-3 through 103-N, while one of the terminals 101 and102 is grounded and the other is either grounded or left floating.

FIG. 13 illustrates one example bias arrangement for reading “bit 5” inthe storage location 104-5 with terminal 102 acting as a drain withpositive 2 Volts applied, and terminal 101 acting as a source withground applied. The gate voltages Vg₁ through Vg₄ and Vg₆ throughVg_(N), are high enough to cause inversions 120 and 121 in the channelregion between the terminals 101 and 102. The inversions 120 and 121,induced by the gate voltages Vg₁ through Vg₄ and Vg₆ through Vg_(N),serve to couple the voltage at the drain or the source to the region inthe channel near the storage location 104-5. The gate voltage Vg₅applied to gate 103-5 is set above the low threshold state for thememory cell, and below the high threshold state. In the illustratedexample, a gate voltage Vg₅ of about 2 Volts is applied.

FIGS. 14 and 15 illustrate alternative biasing arrangements for erasingdata in a memory cell like that of FIG. 10, operated with one bit percontrol gate in the multiple-gate cell, and which is suitable for use incombination with the programming bias arrangement of FIG. 12. Asillustrated in FIG. 14, an erasing bias arrangement for erasing “bit 3”in a storage location beneath the control gate 103-3 includes applying agate voltage Vg₃ of about −5 Volts to gate 103-3, gate voltages Vg₁–Vg₂and Vg₄–Vg_(N) of about 10 volts to gate 103-3, while grounding theterminal 101 and applying about 5 volts to the terminal 102. Thiscreates inversion region 125 beneath the gates 103-1 and 103-2 andinversion region 126 beneath the gates 103-4 through 103-N, and induceshot holes 130 in the substrate beneath the gate 103-3. The hot holes areinjected into the storage location of “bit 3,” displacing electrons andreducing the threshold voltage for the storage location beneath the gate103-3.

As illustrated in FIG. 15, an alternative erasing bias arrangement forerasing “bit 3” in a storage location beneath the control gate 103-3includes applying a gate voltage Vg₃ of about −5 Volts to gate 103-3,gate voltages Vg₁–Vg₂ and Vg₄–Vg_(N) of about 10 volts to gate 103-3,while grounding the terminal 102 and applying about 5 volts to theterminal 101. This creates inversion region 127 beneath the gates 103-1and 103-2 and inversion region 128 beneath the gates 103-4 through103-N, and induces hot holes 131 in the substrate beneath the gate103-3. The hot holes are injected into the storage location of “bit 3,”displacing electrons and reducing the threshold voltage for the storagelocation beneath the gate 103-3.

In some embodiments, “bit 3,” or other selected bits can be erased byapplying first the biasing arrangement of FIG. 14, followed by thebiasing arrangement of FIG. 15, which may tend to balance the chargedistribution in the storage location.

FIG. 16 illustrates an erase procedure suitable for use with the biasingarrangement of FIGS. 14 and 15, where the procedure is required to biaseach bit location separately to induce hot holes in the vicinity of thebit locations. The procedure begins with the command (block 250) toerase all of the data in a memory cell, such as the memory cellillustrated in FIG. 10. A step in the procedure includes setting anindex i=1 (block 251), where the index i corresponds with the gatenumber 1 through N within the memory cell. A bias arrangement is appliedfor the current bit (block 252). The bias arrangement applied can be thearrangement of FIG. 14, the arrangement of FIG. 15, or other biasarrangements. Next, the procedure determines if all bit locations in thecell have been erased, by testing whether the index i=N (block 253). Ifthe index i is not N, then the process proceeds to block 254, incrementsthe index i, and applies the bias arrangement to the next bit locationin the cell at block 251. If the index i is N, then an erase verifyprocedure is executed in this example (block 255). Next, the processtests whether the erase verify procedure passed the memory cell (block256). If it did not pass, then the procedure starts over in thisembodiment at block 251. If the cell did pass erase verify, then theprocedure is finished (block 257). Other embodiments include proceduresfor erasing a plurality of cells in parallel, such as a set of cellssharing the same set of bit lines. Embodiments of the procedure canapply erase verify and retry processes for each bit location, byverifying after block 252 before incrementing the index i, and retryingblock 252, if the verify fails.

FIG. 17 illustrates an embodiment of a multiple-gate memory cell, likethat of FIG. 10, with circuitry, represented by boxes 150, 151, toconduct source and drain bias voltages to terminal locations in thesemiconductor body near the first gate 103-1 and the last gate 103-N inthe series of gates of the cell. The circuitry 150, 151 can beimplemented in many ways. Examples include use of a doped regionterminal, like terminals 101, 102 of FIG. 10, to which contact is madeto conductors supplying voltage to the terminals 101, 102. The terminals101, 102 can be implemented as local contact points to whichinterconnected structures not shown in figure are laid out in metallayers or other layers of the integrated circuit to establish contactwith the terminals. Alternatively, the terminals 101, 102 can beimplemented as conductive lines shared by a column of multiple-gatememory cells, and coupled to circuitry for supplying the voltagesanywhere along the column.

FIG. 18 illustrates another embodiment of the circuitry to conductsource and drain bias voltages to the semiconductor body. In thisembodiment, a first select gate transistor comprising gate 201, a dopedregion at terminal location 202 and a doped region at terminal location203, and a second select gate transistor comprising gate 209, a dopedregion at terminal location 205 and a doped region at terminal location206 are included. The doped regions at terminal locations 202 and 206are coupled to global bit lines or other bit line structures whichdeliver bias voltages to the respective terminals. The bias voltages arecoupled to the doped regions at terminal locations 203 and 205 inresponse to control voltages SLG1 and SLG2 applied to the gates 201,202. A gate dielectric 207, such as a single layer of silicon dioxide,overlies the channel region between the terminals 202 and 203. Likewise,gate dielectric 208 overlies the channel region between the terminals205 and 206.

FIG. 19 illustrates another embodiment of the circuitry to conductsource and drain bias voltages to the semiconductor body. In thisembodiment, a first select gate 210 and a second select gate 211 areimplemented over the semiconductor body and gate dielectrics 214, 215respectively. The first and second select gates 210, 211 are placedbetween the terminal locations 212 and 213, respectively, on oppositeends of the series of gates, and the continuous channel region beneaththe charge storage locations in the multiple-gate memory cell. FIG. 19differs from the embodiment of FIG. 18 by eliminating the doped regionsat terminal locations 203 and 205. Bias voltages are applied via the atterminal locations 212 and 213 by inducing inversion regions beneath thefirst select gate 210 and a second select gate 211, which conductvoltages from the terminals 212 and 213 to the continuous channel regionbeneath the charge storage locations in the multiple-gate memory cell.

FIG. 20 illustrates yet another embodiment of circuitry to conductsource and drain bias voltages to the semiconductor body. The embodimentof FIG. 20 differs from that of FIG. 19 because the charge storagestructure, including top dielectric 105, charge trapping layer 106, andbottom dielectric layer 107 is extended beneath the first select gate220 and the second select gate 221.

FIG. 21 illustrates yet another embodiment of circuitry to conductsource and drain bias voltages to the terminal locations in thesemiconductor body. The embodiment of FIG. 21 differs from that of FIG.10, because the charge storage structure, including top dielectric 105,charge trapping layer 106, and bottom dielectric layer 107 is extendedover the doped region terminals 101 and 102.

FIGS. 22 and 23 illustrate embodiments of the multiple-gate memory cellin which only every other gate overlies a storage location and acts as acontrol gate for reading and writing data. In the illustratedembodiments, select gates are implemented between each of the controlgates. In embodiments like those shown in FIGS. 22 and 23, it may bepreferable to include an odd number of gates in the series of gates forthe multiple-gate cell. Hence, the last gate in the series can beconsidered gate number “N+1.” In the embodiment of FIG. 22,even-numbered gates act as control gates for storage of data. The chargestorage structure can be continuous between all the gates, or segmentedas shown in the figures so that it underlies only the control gates forstorage of data. Thus, gates 173-2, 173-4, 173-6, . . . 173-N overliecharge storage locations 184-2, 184-4, 184-6, 184-N, while gates 174-1,174-3, 174-5, . . . 174-N+1 are used as select gates to induce inversionregions for controlling the programming and reading of the multiple-gatememory cell.

In the embodiment of FIG. 23, odd-numbered gates act as control gatesfor storage of data. The charge storage structure can be continuousbetween all the gates, or segmented as shown in the figures so that itunderlies only the control gates for storage of data. Thus, gates 173-1,173-3, 173-5, . . . 173-N+1 overlie charge storage locations 184-1,184-3, 184-5, 184-N+1, while gates 174-2, 174-4, 174-6, . . . 174-N areused as select gates to induce inversion regions for controlling theprogramming and reading of the multiple-gate memory cell.

FIGS. 24A–24F illustrate one method for manufacturing a multiple-gatememory cell like that of FIG. 10. The process begins as shown in FIG.24A, with providing a semiconductor substrate 300, such as a p-typesilicon substrate or other semiconductor substrate. In embodiments ofthe invention, the substrate 300 is isolated using so-called triple-welltechniques, where the semiconductor substrate 300 comprises a p-typeregion embedded within an n-type region, which is in turn embedded in ap-type region. In the area of the substrate on which multiple-gatememory cells are to be implemented, a bottom oxide layer 301, chargetrapping layer 302, and top oxide layer 303 are formed. These layers canbe formed using a variety of techniques known in the art, includingthermal oxide growth, chemical vapor deposition, plasma enhancedchemical vapor deposition, high-density plasma chemical vapordeposition, atomic layer deposition and other known and emergingtechnologies.

As illustrated in FIG. 24B, after formation of the bottom oxide layer301, charge trapping layer 302, and top oxide layer 303, a layer 304 ofpolysilicon, or other conductive gate material is deposited over thearea on the substrate in which multiple-gate memory cells are to beimplemented. The polysilicon can be deposited using a variety of knowntechnologies.

As illustrated in FIG. 24C, the polysilicon layer 304 is etched in apattern to form gate electrodes 304 x. In some embodiments, the gateelectrodes are implemented by word line structures, which would extendin parallel lines across the area in which the cells are to beimplemented, into the page of the drawing.

As illustrated in FIG. 24D, the plurality of gate electrodes 304 x arecovered, including the sidewalls, in a next step with an isolation layer305 of dielectric material, such as silicon dioxide, silicon nitride, orother insulating material. The layer 305 of dielectric material coversthe sidewalls of the gate electrodes 304 x, to isolate it from adjacentgates which fills the gaps. The thickness of the isolation layer 305 onthe sidewalls of the gate electrodes is less than 100 nm in oneembodiment. In embodiments having a minimum feature size F, thethickness is preferably less than 0.1 F. Generally, the thickness of theisolation layer as small as possible in the context, and substantiallyless than the lengths of the gate electrodes 304 x.

As illustrated in FIG. 24E, a second polysilicon deposition is performedto form gate electrodes 306 x between the gate electrodes 304 x. Thesecond polysilicon deposition can be implemented using chemical vapordeposition or other techniques, which effectively fill the gaps. Asillustrated, the gate electrodes 306 x have the same height as the gateelectrodes 304 x. In other embodiments, the electrodes may not be thesame height. In some embodiments, a chemical mechanical polishingtechnique for other planarizing technique can be used.

The gate electrodes 304 x and 306 x may include top layers of silicideor metal to improve conductivity as known in the art.

Finally, as illustrated in FIG. 24F, the charge storage structureincluding the bottom oxide layer 301, charge trapping layer 302, topoxide layer 303 and polysilicon layers are patterned and etched toexpose implant regions in the substrate 300, and n-type impurities areimplanted in the terminal locations, to form source terminals 307 anddrain terminals 308. As a result of the process steps of FIGS. 24A–24F,a multiple-gate memory cell like that shown in FIG. 10 is implemented.Essentially the same sequence of steps can be applied to implement anarray of such memory cells. Likewise, variations on the structure can bereadily implemented using techniques known in the art.

FIG. 25 illustrates a step of an embodiment of a process in which thebottom oxide layer 301, charge trapping layer 302, and top oxide layer303 are not removed in the regions of the implants for the sourceterminal 317 and drain terminal 318 on the memory cell. Thus the implantprocedure is modified as an alternative to the step of FIG. 24F, so thatthe implants are made through the layers of material used to implementthe charge trapping structure.

FIGS. 26A–26D illustrate one method for manufacturing a multiple-gatememory cell like that of FIG. 22. The process as before begins as shownin FIGS. 24A–24B, with providing a semiconductor substrate 300. In thearea of the substrate on which multiple-gate memory cells are to beimplemented, a bottom oxide layer 301, charge trapping layer 302, andtop oxide layer 303 are formed. FIG. 26A shows a next step in a processto implement the memory cell with storage locations under even numberedgates in the memory cell, as shown in FIG. 22. In the process of FIGS.26A–26D, the structure of FIG. 24B is patterned and etched withoutstopping at the top oxide 303 as done in FIG. 24C. Rather, the etchproceeds through the layers of material (301, 302, 303) used to make thecharge storage locations to the substrate 300, leaving multilayer stacks351–356, including charge storage locations beneath the polysiliconcontrol gates. In the step illustrated in FIG. 26B, a layer of insulator340 such as silicon dioxide is formed isolating the multilayer stacks351–356 and providing a gate dielectric in the spaces 341–347. The stepillustrated in FIG. 26C includes filling the spaces 341–347 withpolysilicon. In the step illustrated in FIG. 26D, source and drainimplants 349, 350 are made at terminal locations to complete the memorycell.

FIG. 27 is a simplified block diagram of an integrated circuit accordingto an embodiment of the present invention. The integrated circuit 450includes a memory array 400 implemented using multiple-gate; localizedcharge trapping memory cells, on a semiconductor substrate. A rowdecoder 401 is coupled to a plurality of word lines 402 and to selectgate lines for the multiple-gate memory cells, and arranged along rowsin the memory array 400. A column decoder 403 is coupled to a pluralityof bit lines 404 arranged along columns in the memory array 400 fordelivering source and drain voltages and for reading data from themultiple-gate memory cells in the array 400. Addresses are supplied onbus 405 to column decoder 403 and row decoder 401. Sense amplifiers anddata-in structures in block 406 are coupled to the column decoder 403via data bus 407. Data is supplied via the data-in line 411 frominput/output ports on the integrated circuit 450, or from other datasources internal or external to the integrated circuit 450, to thedata-in structures in block 406. Data is supplied via the data-out line412 from the sense amplifiers in block 406 to input/output ports on theintegrated circuit 450, or to other data destinations internal orexternal to the integrated circuit 450.

A controller implemented in this example using bias arrangement statemachine 409 controls the application of bias arrangement supply voltages408, such as read, program, erase, erase verify and program verifyvoltages. The controller can be implemented using special-purpose logiccircuitry as known in the art. In alternative embodiments, thecontroller comprises a general-purpose processor, which may beimplemented on the same integrated circuit, which executes a computerprogram to control the operations of the device. In yet otherembodiments, a combination of special-purpose logic circuitry and ageneral-purpose processor may be utilized for implementation of thecontroller.

FIG. 28 illustrates an embodiment in which there are two data storagelocations beneath each control gate, for a cell having two control gates501, 502. The cell illustrated comprises a semiconductor substrate 500,with an n-type terminal 503 and an n-type terminal 504 acting as sourceand drain for the memory cell. Charge storage locations for four bitsare illustrated, where bit 1-1 and bit 1-2 are beneath the control gate501, and bit 2-1 and bit 2-2 are beneath control gate 502. Bias voltagesVg₁ and Vg₂ are applied to the gate 501 and 502 respectively. In someembodiments, more than one bit can be stored in each of the two storagelocations beneath each gate in the memory cell. A bias voltage Vs isapplied to one of the terminals 503, 504, and a bias voltage Vd isapplied to the other of the terminals 504, 503, depending on whichterminal is performing the functions of a source and which is performingthe function of a drain, for the memory cell. A bias voltage Vb isapplied to the substrate 500. Bias arrangements are applied forprogramming, erasing and reading data in the charge storage locations.

FIGS. 29 and 30 illustrate alternative bias arrangements for erasing thestorage locations beneath particular gates. In the bias arrangement ofFIG. 29, Fowler Nordheim FN tunneling (indicated by the symbol 505) isinduced between the substrate 500 and the charge storage locationsbeneath the gate 501, by applying a positive gate voltage Vg₁ of about 8volts in this example, to gate 501, applying about zero volts to gate502, and applying about −10 volts to each of the source terminal 503,the drain terminal 504, and the substrate 500. The FN tunneling causesan increase in the threshold voltage of the cell, and establishes a highthreshold erase state. In the bias arrangement of FIG. 30, FN tunneling(indicated by the symbol 506) is induced between the gate 501 and thecharge storage locations beneath the gate 501, by applying a negativegate voltage Vg₁ of about −8 volts in this example, to gate 501,applying about zero volts to gate 502, and applying about positive 10volts to the substrate 500, while floating each of the source terminal503 and the drain terminal 504. The FN tunneling causes an increase inthe threshold voltage of the cell, and establishes a high thresholderase state.

Bias arrangements for programming two charge storage locations undereach gate in the memory cells, which is suitable for use in combinationwith erase bias arrangements like those of FIGS. 29 and 30, isillustrated in FIGS. 31–34 based on hot hole injection. As shown in FIG.31, bit 1-1 can be programmed by hot hole injection using a biasarrangement like that shown in the figure, in which gate 501 receivesVg₁=−5 volts, gate 502 receives Vg₂=+10 volts, terminal 503 receivesVs=+5 volts, terminal 504 receives Vd=0 volts and the substrate receivesVb=0 volts. The bias arrangement induces inversion 510 beneath the gate502 due to the relatively high voltage on gate 502. Also, hot holesinduced in the channel region adjacent the n⁺ implant region that actsas terminal 503 are injected as indicated by the symbol 511 into thecharge storage structure, displacing electrons and reducing thethreshold of the memory cell in the charge storage location for bit 1-1.

As shown in FIG. 32, bit 1-2 can be programmed by hot hole injectionusing a bias arrangement like that shown in the figure, in which gate501 receives Vg₁=−5 volts, gate 502 receives Vg₂=+10 volts, terminal 503receives Vs=0 volts, terminal 504 receives Vd=+5 volts and the substratereceives Vb=0 volts. The bias arrangement induces inversion 512 beneaththe gate 502 due to the relatively high voltage on gate 502. Also, hotholes induced in the channel region adjacent the inversion region 512are injected as indicated by the symbol 513 into the charge storagestructure, displacing electrons and reducing the threshold of the memorycell in the charge storage location for bit 1-2.

As shown in FIG. 33, bit 2-1 can be programmed by hot hole injectionusing a bias arrangement like that shown in the figure, in which gate501 receives Vg₁=+10 volts, gate 502 receives Vg₂=−5 volts, terminal 503receives Vs=+5 volts, terminal 504 receives Vd=0 volts and the substratereceives Vb=0 volts. The bias arrangement induces inversion 514 beneaththe gate 501 due to the relatively high voltage on gate 501. Also, hotholes induced in the channel region adjacent the inversion region 514are injected as indicated by the symbol 515 into the charge storagestructure, displacing electrons and reducing the threshold of the memorycell in the charge storage location for bit 2-1.

As shown in FIG. 34, bit 2-2 can be programmed by hot hole injectionusing a bias arrangement like that shown in the figure, in which gate501 receives Vg₁=+10 volts, gate 502 receives Vg₂=−5 volts, terminal 503receives Vs=0 volts, terminal 504 receives Vd=+5 volts and the substratereceives Vb=0 volts. The bias arrangement induces inversion 516 beneaththe gate 501 due to the relatively high voltage on gate 501. Also, hotholes induced in the channel region adjacent the n⁺ implant region thatacts as terminal 504 are injected as indicated by the symbol 517 intothe charge storage structure, displacing electrons and reducing thethreshold of the memory cell in the charge storage location for bit 2-2.

Bias arrangements for reading two charge storage locations under eachgate in the memory cells, which are suitable for use in combination witherase bias arrangements like those of FIGS. 29 and 30, and program biasarrangements like those of FIGS. 31–34, are shown in. FIGS. 35–38. Asshown in FIG. 35, bit 1-1 can be read using a reverse read biasarrangement like that shown in the figure, in which gate 501 receivesVg₁=2 volts, gate 502 receives Vg₂=+10 volts, terminal 503 receives Vs=0volts, terminal 504 receives Vd=+2 volts and the substrate receives Vb=0volts. The bias arrangement induces inversion 510 beneath the gate 502due to the relatively high voltage on gate 502. The threshold of thememory cell for this reverse read bias arrangement is determined by thecharge stored in the location of bit 1-1. If the charge storage locationat the bit 1-1 is erased establishing a high threshold state, then nocurrent flows under the read bias arrangement. Alternatively, if thecharge storage location at bit 1-1 is programmed establishing a lowthreshold state, then current flows under the read bias arrangementthrough the channel of the memory cell.

As shown in FIG. 36, bit 1-2 can be read using a reverse read biasarrangement like that shown in the figure, in which gate 501 receivesVg₁=+2 volts, gate 502 receives Vg₂=+10 volts, terminal 503 receivesVs=+2 volts, terminal 504 receives Vd=0 volts and the substrate receivesVb=0 volts. The bias arrangement induces inversion 512 beneath the gate502 due to the relatively high voltage on gate 502. If the chargestorage location at the bit 1-2 is erased establishing a high thresholdstate, then no current flows under the read bias arrangement.Alternatively, if the charge storage location at bit 1-2 is programmedestablishing a low threshold state, then current flows under the readbias arrangement through the channel of the memory cell.

As shown in FIG. 37, bit 2-1 can be read using a reverse read biasarrangement like that shown in the figure, in which gate 501 receivesVg₁=+10 volts, gate 502 receives Vg₂=+2 volts, terminal 503 receivesVs=0 volts, terminal 504 receives Vd=+2 volts and the substrate receivesVb=0 volts. The bias arrangement induces inversion 514 beneath the gate501 due to the relatively high voltage on gate 501. If the chargestorage location at the bit 2-1 is erased establishing a high thresholdstate, then no current flows under the read bias arrangement.Alternatively, if the charge storage location at bit 2-1 is programmedestablishing a low threshold state, then current flows under the readbias arrangement through the channel of the memory cell.

As shown in FIG. 38, bit 2-2 can be read using a reverse read biasarrangement like that shown in the figure, in which gate 501 receivesVg₁=+10 volts, gate 502 receives Vg₂=+2 volts, terminal 503 receivesVs=+2 volts, terminal 504 receives Vd=0 volts and the substrate receivesVb=0 volts. The bias arrangement induces inversion 516 beneath the gate501 due to the relatively high voltage on gate 501. If the chargestorage location at the bit 2-2 is erased establishing a high thresholdstate, then no current flows under the read bias arrangement.Alternatively, if the charge storage location at bit 2-2 is programmedestablishing a low threshold state, then current flows under the readbias arrangement through the channel of the memory cell.

The cell structure of FIG. 28 having two gates, and two storagelocations associated with each gates, is extended to an embodiment asillustrated in FIG. 39, having N gates, where N is greater than 2. Themultiple-gate memory cell in FIG. 39 is formed in a semiconductor body600 having a p-type impurity. N-type terminals 601, 602 act as sourceand drain for the multiple-gate memory cell. The charge storagestructure comprising a top dielectric 605, a charge trapping dielectric606, and a bottom dielectric 607 overlie a continuous channel regionbetween the terminals 601, 602. Control gates 603-1 through 603-Noverlie the charge storage structure and the channel region.

According to the illustrated embodiment, there are two charge storagelocations associated with each of the control gates 603-1 through 603-N.Thus, as illustrated, charge storage locations 604-1-1 and 604-1-2 areassociated with gates 603-1. Charge storage locations 604-2-1 and604-2-2 are associated with gates 603-2. Charge storage locations604-3-1 and 604-3-2 are associated with gates 603-3. Charge storagelocations 604-4-1 and 604-4-2 are associated with gates 603-4. Chargestorage locations 604-5-1 and 604-5-2 are associated with gates 603-5.Charge storage locations 604-6-1 and 604-6-2 are associated with gates603-6. Charge storage locations 604-(N−1)-1 and 604-(N−1)-2 areassociated with gates 603-N-1. Charge storage locations 604-N-1 and604-N-2 are associated with gates 603-N. Circuitry associated with thememory cell applies bias voltages for programming, erasing and readingdata stored in the charge storage locations. The bias voltages includeVg₁ through Vg_(N) at the control gates 603-1 through 603-N,respectively. The bias voltages include Vs applied to terminals 601, andVd applied to terminal 602. Finally, the bias voltages include Vbapplied to the semiconductor body 600. The semiconductor body 600comprises an isolated region in a larger semiconductor substrate in someembodiments as discussed above.

Representative bias arrangements for erasing, programming and readingthe memory cell of FIG. 39 are explained with reference to FIGS. 40–45.

Alternative erase bias arrangements are shown in FIGS. 40 and 41. InFIG. 40, a positive gate voltage FN tunneling bias arrangement is usedfor erasing charge storage locations beneath the selected gates in themultiple-gate memory cell. Thus, according to the bias arrangementillustrated in FIG. 40, selected gates 603-1, 603-3, 603-4, 603-6,603-N-1 and 603-N are erased by applying Vg₁, Vg₃, Vg₄, Vg₆, Vg_((N−1))and Vg_(N) of about +8 volts, Vg₂ and Vg₅ of about 0 volts, and Vs, Vdand Vb of about −10 volts. This bias arrangement induces electrontunneling from the substrate to the charge storage structure, asindicated by symbols 610-1, 610-3, 610-4, 610-6, 610-N-1 and 610-Nbeneath the selected gates 603-1, 603-3, 603-4, 603-6, 603-N-1 and603-N. The electron tunneling causes an increase in threshold voltage toa target erase threshold state for both storage locations associatedwith each selected gate. The unselected gates 603-2 and 603-5 receive agate voltage of about 0 volts, which is insufficient to induce tunnelingof electrons sufficient to significantly disturb a previouslyestablished threshold state in the unselected memory cells.

FIG. 41 illustrates a negative gate voltage FN tunneling biasarrangement, as an alternative to the bias arrangement of FIG. 40.According to the bias arrangement illustrated in FIG. 40, selected gates603-1, 603-3, 603-4, 603-6, 603-N-1 and 603-N are erased by applyingVg₁, Vg₃, Vg₄, Vg₆, Vg_((N−1)) and Vg_(N) of about −8 volts, Vg₂ and Vg₅of about 0 volts, and Vs, Vd and Vb of about +10 volts. This biasarrangement induces electron tunneling from the selected control gates603-1, 603-3, 603-4, 603-6, 603-N-1 and 603-N to the charge storagestructure, as indicated by symbols 611-1, 611-3, 611-4, 611-6, 611-N-1and 611-N. The electron tunneling effects an increase in thresholdvoltage to a target erase threshold state for both storage locationsassociated with each selected gate. The unselected gates 603-2 and 603-5receive a gate voltage of about 0 volts, which is insufficient to inducetunneling of electrons sufficient to significantly disturb a previouslyestablished threshold state in the unselected memory cells.

FIGS. 42 and 43 illustrate left side and right side programming byband-to-band tunneling induced hot hole injection for the memory cell ofFIG. 39. To program a storage location on a left side, for example thestorage location 604-5-1 beneath gate 603-5, the bias arrangementillustrated in FIG. 42 is used. According to the bias arrangement ofFIG. 42, the unselected gates 603-1 through 603-4 and 603-6 through603-N receive a high voltage such as about +10 volts, while the selectedgate 603-5 receives a Vg₅ of about −5 volts. The terminal 601 receivesVs equal to about +5 volts and the terminal 602 receives Vd equal toabout 0 volts. Likewise, the substrate receives Vb of about 0 volts. Therelatively high voltage on the unselected gates induces inversionregions 615 and 616 which couple the terminals 601 and 602 to thechannel region beneath gate 603-5. Band-to-band tunneling induced hotholes as indicated by the symbol 617 are induced at the edge of theinversion region 615 beneath the control gate 603-5, and injected intothe charge storage location 604-5-1, sufficient to lower the thresholdvoltage of the left side storage location associated with the selectedgate 603-5 to a target program state.

FIG. 43 illustrates the bias arrangement for programming a right sidestorage location associated with a selected gate. To program a storagelocation on a right side, for example the storage location 604-3-2beneath gate 603-3, the bias arrangement illustrated in FIG. 43 is used.According to the bias arrangement of FIG. 43, the unselected gates 603-1through 603-2 and 603-4 through 603-N receive a high voltage such asabout +10 volts, while the selected gate 603-3 receives a Vg₃ of about−5 volts. The terminal 601 receives Vs equal to about 0 volts and theterminal 602 receives Vd equal to about +5 volts. Likewise, thesubstrate receives Vb of about 0 volts. The relatively high voltage onthe unselected gates induces inversion regions 625 and 626 which couplethe terminals 601 and 602 to the channel region beneath gate 603-3.Band-to-band tunneling induced hot holes as indicated by the symbol 627are induced at the edge of the inversion region 626 beneath the controlgate 603-3, and injected into the charge storage location 604-3-2,sufficient to lower the threshold voltage of the right side storagelocation associated with the selected gate 603-3 to a target programstate.

FIGS. 44 and 45 illustrate left side and right side reverse read biasarrangements for the memory cell of FIG. 39. To read a storage locationon a left side, for example the storage location 604-5-1 beneath gate603-5, the bias arrangement illustrated in FIG. 44 is used. According tothe bias arrangement of FIG. 44, the unselected gates 603-1 through603-4 and 603-6 through 603-N receive a high voltage such as about +10volts, while the selected gate 603-5 receives a Vg₅ of about +2 volts.The terminal 601 receives Vs equal to about 0 volts and the terminal 602receives Vd equal to about +2 volts. Likewise, the substrate receives Vbof about 0 volts. The relatively high voltage on the unselected gatesinduces inversion regions 635 and 636 which couple the terminals 601 and602 to the channel region beneath gate 603-5. If the charge storagelocation 604-5-1 has a high threshold state (erased), then current flowis blocked between the terminals 601 and 602. Alternatively, if thecharge storage location 604-5-1 has a low threshold state (programmed),then current flow is caused between the terminals 601 and 602. Thecurrent flow can be sensed to indicate the data stored in the chargestorage location 604-5-1.

To read a storage location on a left side, for example the storagelocation 604-3-2 beneath gate 603-3, the bias arrangement illustrated inFIG. 45 is used. According to the bias arrangement of FIG. 45, theunselected gates 603-1, 603-2 and 603-4 through 603-N receive a highvoltage such as about +10 volts, while the selected gate 603-3 receivesa Vg₅ of about +2 volts. The terminal 601 receives Vs equal to about +2volts and the terminal 602 receives Vd equal to about 0 volts. Likewise,the substrate receives Vb of about 0 volts. The relatively high voltageon the unselected gates induces inversion regions 645 and 646 whichcouple the terminals 601 and 602 to the channel region beneath gate603-3. If the charge storage location 604-3-2 has a high threshold state(erased), then current flow is blocked between the terminals 601 and602. Alternatively, if the charge storage location 604-3-2 has a lowthreshold state (programmed), then current flow is caused between theterminals 601 and 602. The current flow can be sensed to indicate thedata stored in the charge storage location 604-3-2.

FIGS. 46–52 illustrate schematically representative embodiments of arraylayouts for multiple-gate memory cells as described herein, using thesymbol for the multiple-gate cell shown in FIG. 11. The array layoutsillustrated can be used with a single bit per cell and multiple bits percell embodiments, including embodiments where more than one bit isstored in each storage location associated with each control gate, asdiscussed in more detail above.

FIG. 46 illustrates a first layout embodiment, where multiple-gatememory cells 700–706, having the structure shown in FIG. 18, are laidout with bit lines BL_(N−3) through BL_(N+3). Word lines are arranged todeliver the bias voltages Vg₁ through Vg_(N) in parallel tocorresponding gates in the multiple-gate memory cells. The bit linesBL_(N−3) through BL_(N+3) are arranged to deliver one of the biasvoltages Vs and Vd to bottom terminals of the multiple-gate memory cells700–706 through select gates 710–716, respectively. The select gates710–716 have their gates coupled to a bias line arranged in parallelwith the word lines, and carrying control signal SLG2. Also, the bitlines BL_(N−3) through BL_(N+3) are arranged to deliver the other of thebias voltages Vs and Vd, to top terminals of the multiple-gate memorycells 700–706 through select gates 720–726, respectively. The selectgates 720–726 have their gates coupled to a bias line arranged inparallel with the word lines, and carrying control signal SLG1. The bitlines BL_(N−3) through BL_(N+3) are typically implemented using a metallayer on the integrated circuit, and are coupled to the source or drainterminals of the select gates 710–716 or 720–726, using contact vias,such as contact vias 718 and 728. In the array layout illustrated, themultiple-gate memory cell 706 is coupled via select gates 716 and 726 tothe bit lines BL_(N+3) and BL_(N+2), respectively. The multiple-gatememory cell 705 is coupled via select gates 715 and 725 to the bit linesBL_(N+1) and BL_(N+2), respectively. The multiple-gate memory cell 704is coupled via select gates 714 and 724 to the bit lines BL_(N+1) andBL_(N), respectively. The multiple-gate memory cell 703 is coupled viaselect gates 713 and 723 to the bit lines BL_(N−1) and BL_(N),respectively. The multiple-gate memory cell 702 is coupled via selectgates 712 and 722 to the bit lines BL_(N−1) and BL_(N−2), respectively.The multiple-gate memory cell 701 is coupled via select gates 711 and721 to the bit lines BL_(N−3) and BL_(N−2), respectively. Themultiple-gate memory cell 700 is coupled via select gates 710 and 720 tothe bit lines BL_(N−3) and BL_(N−4) (not shown), respectively. In theembodiment of FIG. 46, the multiple-gate memory cells are arranged inparallel, and connection of a single multiple-gate memory cell to bitlines in the array is controlled by two select gates. The sources of twoadjacent parallel cells are coupled together and to a single bit line.Likewise, the drains of two adjacent parallel cells are coupled togetherand to a single bit line.

FIG. 47 illustrates an alternative layout embodiment, wheremultiple-gate memory cells 700–706, having the structure shown in FIG.18, are laid out with bit lines BL_(N−3) through BL_(N+3). Word linesare arranged to deliver the bias voltages Vg₁ through Vg_(N) in parallelto corresponding gates in the multiple-gate memory cells. The bit linesBL_(N−3) through BL_(N+3) are arranged to deliver the bias voltages Vdto the top terminals of the multiple-gate memory cells 700–706 throughselect gates 720–726, respectively. Also, a horizontal source line 719,implemented with buried doped regions or with metal layers, is arrangedto deliver the bias voltage Vs to the bottom terminals of themultiple-gate memory cells 700–706 through select gates 710–716,respectively. The select gates 710–716 have their gates coupled to abias line arranged in parallel with the word lines, and carrying controlsignal SLG2. The bit lines BL_(N−3) through BL_(N+3) are typicallyimplemented using a metal layer on the integrated circuit, and arecoupled to the drain terminals of the select gates 720–726, usingcontact vias, such as contact via 728. In the array layout illustrated,the multiple-gate memory cell 706 is coupled via select gates 716 and726 to the bit line BL_(N+3) and the source line 719, respectively. Themultiple-gate memory cell 705 is coupled via select gate 725 to the bitline BL_(N+2) and the source line 719, respectively. The multiple-gatememory cell 704 is coupled via select gate 724 to the bit line BL_(N+1)and the source line 719, respectively. The multiple-gate memory cell 703is coupled via select gate 723 to the bit line BL_(N) and the sourceline 719, respectively. The multiple-gate memory cell 702 is coupled viaselect gate 722 to the bit line BL_(N−1) and the source line 719,respectively. The multiple-gate memory cell 701 is coupled via selectgate 721 to the bit line BL_(N−2) and the source line 719, respectively.The multiple-gate memory cell 700 is coupled via select gate 720 to thebit line BL_(N−3) and the source line 719, respectively. In theembodiment of FIG. 47, the sources of all of the parallel cells in thesector are coupled together, and to the horizontal source line, which isorthogonal to the bit line directions. The drain of each multiple-gatememory cell is coupled to a single bit line, which is not shared withadjacent bit lines.

FIG. 48 illustrates another layout embodiment, similar to the layout ofFIG. 46. In the embodiment of FIG. 48, the select gates 720–726 and710–716 are arranged to provide a decoding function by which only onemultiple-gate memory cell may be connected to a bit line at a time. Inparticular, the select gates 721, 723, 725 have their gates terminalscoupled to the control signal SLG1, while the select gates 720, 722,724, 726 have their gates coupled to the control signal SLG2. Likewise,the select gates 711, 713, 715 have their gate terminals coupled to thecontrol signal SLG4, while the select gates 710, 712, 714, 716 havetheir gates coupled to the control signal SLG3. Otherwise thearrangement is similar to that described in FIG. 46. In the embodimentof FIG. 48, connection of the bit lines to a single multiple-gate memorycell is controlled by two select gates. The sources of two adjacentparallel cells are coupled together and to a single bit line. Likewise,the drains of two adjacent parallel cells are coupled together and to asingle bit line. The select gates are controlled said the adjacentparallel cells are not connected to the shared bit line at the sametime.

FIG. 49 illustrates a first layout embodiment, where multiple-gatememory cells 740–746, having the structure shown in FIG. 20, are laidout with bit lines BL_(N−3) through BL_(N+3). Word lines are arranged todeliver the bias voltages Vg₁ through Vg_(N) in parallel tocorresponding gates in the multiple-gate memory cells. The bit linesBL_(N−3) through BL_(N+3) are arranged to deliver one of the biasvoltages Vs and Vd, to top terminals of the multiple-gate memory cells740–746, respectively. The top control gates 750–756 in themultiple-gate memory cells are coupled to a bias line arranged inparallel with the word lines, and carrying control signal SLG1. Also,the bit lines BL_(N−3) through BL_(N+3) are arranged to deliver theother of the bias voltages Vs and Vd, to bottom terminals of themultiple-gate memory cells 740–746. The bottom control gates 760–766 arecoupled to a bias line arranged in parallel with the word lines, andcarrying control signal SLG2. The bit lines BL_(N−3) through BL_(N+3)are typically implemented using a metal layer on the integrated circuit,and are coupled to the source or drain terminals of the select gates710–716 or 720–726, using contact vias, such as contact vias 748 and749. In the array layout illustrated, the multiple-gate memory cell 746is coupled in response to the signals SGL1 and SLG2 on its top andbottom control gates, to the bit lines BL_(N+3) and BL_(N+2),respectively. The multiple-gate memory cell 745 is coupled in responseto the signals SGL1 and SLG2 on its top and bottom control gates, to thebit lines BL_(N+1) and BL_(N+2), respectively. The multiple-gate memorycell 744 is coupled in response to the signals SGL1 and SLG2 on its topand bottom control gates, to the bit lines BL_(N+1) and BL_(N),respectively. The multiple-gate memory cell 743 is coupled in responseto the signals SGL1 and SLG2 on its top and bottom control gates, to thebit lines BL_(N−1) and BL_(N), respectively. The multiple-gate memorycell 742 is coupled in response to the signals SGL1 and SLG2 on its topand bottom control gates, to the bit lines BL_(N−1) and BL_(N−2),respectively. The multiple-gate memory cell 741 is coupled in responseto the signals SGL1 and SLG2 on its top and bottom control gates, to thebit lines BL_(N−3) and BL_(N−2), respectively. The multiple-gate memorycell 740 is coupled in response to the signals SGL1 and SLG2 on its topand bottom control gates, to the bit lines BL_(N−3) and BL_(N−4) (notshown), respectively. The top and bottom control gates in each cell areoperated to maintain the storage locations associated with them in a lowthreshold state, allowing them to be used instead of select gates, likeselect gates 710–716 and 720–726 in the array embodiment of FIG. 46. Inthe embodiment of FIG. 49, the multiple-gate memory cells are arrangedin parallel, and connection of a single multiple-gate memory cell to bitlines in the array is controlled by two select gates. The sources of twoadjacent parallel cells are coupled together and to a single bit line.Likewise, the drains of two adjacent parallel cells are coupled togetherand to a single bit line.

FIG. 50 illustrates a first layout embodiment, where multiple-gatememory cells 740–746 having the structure shown in FIG. 20, are laid outwith bit lines BL_(N−3) through BL_(N+3). Word lines are arranged todeliver the bias voltages Vg₁ through Vg_(N) in parallel tocorresponding a gates in the multiple-gate memory cells. The bit linesBL_(N−3) through BL_(N+3) are arranged to deliver the bias voltage Vd totop terminals of the multiple-gate memory cells 740–746, respectively.The fop control gates 750–756 in the multiple-gate memory cells arecoupled to a bias line arranged in parallel with the word lines, andcarrying control signal SLG1. Also, a horizontal source line 769,implemented with buried doped regions or with metal layers, is arrangedto deliver the bias voltages Vs to bottom terminals of the multiple-gatememory cells 740–746. The bottom control gates 760–766 are coupled to abias line arranged in parallel with the word lines, and carrying controlsignal SLG2. The bit lines BL_(N−3) through BL_(N+3) are typicallyimplemented using a metal layer on the integrated circuit, and arecoupled to the drain terminals of the multiple-gate memory cells, usingcontact vias, such as contact via 758. In the array layout illustrated,the multiple-gate memory cell 746 is coupled in response to the signalsSGL1 and SLG2 on its top and bottom control gates, to the bit lineBL_(N+3) and the source line 769, respectively. The multiple-gate memorycell 745 is coupled in response to the signals SGL1 and SLG2 on its topand bottom control gates, to the bit line BL_(N+2) and the source line769, respectively. The multiple-gate memory cell 744 is coupled inresponse to the signals SGL1 and SLG2 on its top and bottom controlgates, to the bit line BL_(N+1) and the source line 769, respectively.The multiple-gate memory cell 743 is coupled in response to the signalsSGL1 and SLG2 on its top and bottom control gate to the bit line BL_(N)and the source line 769, respectively. The multiple-gate memory cell 742is coupled in response to the signals SGL1 and SLG2 on its top andbottom control gates to the bit lines BL_(N−1) and the source line 769,respectively. The multiple-gate memory cell 741 is coupled in responseto the signals SGL1 and SLG2 on its top and bottom control gates to thebit lines BL_(N−2) and the source line 769, respectively. Themultiple-gate memory cell 740 is coupled in response to the signals SGL1and SLG2 on its top and bottom control gates to the bit lines BL_(N−3)and the source line 769, respectively. The top and bottom control gatesin each cell are operated to maintain the storage locations associatedwith them in a low threshold state, allowing them to be used instead ofselect gates, like select gates 710–716 and 720–726 in the arrayembodiment of FIG. 47. In the embodiment of FIG. 50, the sources of allof the parallel cells in the sector are coupled together, and to thehorizontal source line, which is orthogonal to the bit line directions.The drain of each multiple-gate memory cell is coupled to a single bitline, which is not shared with adjacent bit lines.

FIG. 51 illustrates the layout of a memory block comprising multiplesectors of multiple-gate memory cells, like the sector illustrated inFIG. 46. The layout can be utilized for the sector structuresillustrated in FIGS. 47–50 as well. In FIG. 51, a first sector 800 and asecond sector 801 are illustrated. The first sector 800 and the secondsector 801 share contacts 802, 803, 804, 805 between them. The firstsector 800 shares contacts 806, 807, 808 with a sector above it, whichhas an identical layout. Likewise, the second sector shares contacts809, 810, 811 with a sector below it, which has an identical layout. Thesectors are repeated to form a memory block, and the blocks are repeatedto form a large array on an integrated circuit. In an alternativeembodiment, the first sector 800 and the second sector 801 can be laidout in a mirror image fashion, around the shared contacts. An arrayincluding a plurality of memory blocks as shown in FIG. 51 is utilizedin a high density memory device, such as illustrated in FIG. 27.

Although there is only one multiple-gate memory cell between each selectgate pair in the embodiments illustrated in FIGS. 46–48 and 51, otherembodiments include more than one multiple-gate memory cell betweenselect gates. Likewise, FIGS. 48 and 49 illustrate arrays having asingle multiple-gate memory cell in series between contacts to the bitlines, or to the bit line in the horizontal source line. In otherembodiments there can be multiple multiple-gate memory cells in series,with the top gate of the top multiple-gate memory cell in the seriesacting as the top select gate, and the bottom gate of the bottommultiple-gate memory cell in the series acting as the bottom selectgate.

The technology described herein provides high-density memory, capable ofstoring multiple bits per cell, which can be manufactured using simpleprocesses. In addition, the program and erase operations can beaccomplished with relatively low power.

While the present invention is disclosed by reference to the preferredembodiments and examples detailed above, it is to be understood thatthese examples are intended in an illustrative rather than in a limitingsense. It is contemplated that modifications and combinations willreadily occur to those skilled in the art, which modifications andcombinations will be within the spirit of the invention and the scope ofthe following claims.

1. An integrated circuit memory device, comprising: a semiconductorbody; a plurality of gates arranged in series on the semiconductor body,the plurality of gates including a first gate in the series and a lastgate in the series, with insulating members isolating gates in theseries from adjacent gates in the series; a charge storage structure onthe semiconductor body, the charge storage structure includingnon-conductive charge trapping locations beneath more than one of theplurality of gates in the series; circuitry to conduct source and drainbias voltages to the semiconductor body near the first gate and near thelast gate in the series; and circuitry to conduct gate bias voltages tothe plurality of gates; wherein the semiconductor body includes acontinuous, multiple-gate channel region beneath the plurality of gatesin the series, the multiple-gate channel region having one of n-type andp-type conductivity; and a controller which controls the circuitry toconduct source and drain bias voltages and the circuitry to conduct gatebias voltages for storing data in charge trapping locations beneath eachof said more than one of the plurality of gates in the series, thecontroller being arranged to control a program procedure, an eraseprocedure and a read procedure for the storage locations beneath each ofsaid more than one of the plurality of gates in the series, and whereinthe erase procedure includes erasing a storage location beneath aselected gate in the series in the multiple-gate memory cell, while noterasing a storage location beneath another gate in the series.
 2. Thedevice of claim 1, including charge trapping locations beneath all thegates in the series.
 3. The device of claim 1, wherein the circuitry toconduct source and drain bias voltages comprises conductive materialarranged as bit lines, and the circuitry to conduct gate bias voltagescomprises conductive material arranged as word lines.
 4. The device ofclaim 1, wherein the erase procedure includes inducing hole injectioncurrent into the charge trapping location beneath the selected gate inthe series.
 5. The device of claim 1, wherein the erase procedureincludes inducing hole injection current into the charge trappinglocation beneath the selected gate in the series, while not erasing astorage location beneath another gate in the series, and the programprocedure includes inducing electron injection current into the chargetrapping location beneath a selected gate in the series, while notprogramming a storage location beneath another gate in the series. 6.The device of claim 1, wherein the multiple-gate memory cell includes afirst terminal location adjacent the first gate in the series and asecond terminal location adjacent the last gate in the series, and theerase procedure includes inducing hot hole injection current byband-to-band tunneling induced hot hole injection from the substrate tothe charge storage structure beneath the selected gate on one or bothsides of a region beneath the selected gate.
 7. The device of claim 1,wherein the charge storage structure comprises a dielectric stackincluding a bottom dielectric layer, a charge trapping dielectric layerand a top dielectric layer.
 8. The device of claim 1, wherein the chargestorage structure comprises a dielectric stack including a bottomdielectric layer, a charge trapping dielectric layer and a topdielectric layer, and wherein the charge trapping dielectric layercomprises silicon nitride.
 9. An integrated circuit memory device,comprising: a semiconductor body; a plurality of gates arranged inseries on the semiconductor body, the plurality of gates including afirst gate in the series and a last gate in the series with insulatingmembers isolating gates in the series from adjacent gates in the series;a charge storage structure on the semiconductor body, the charge storagestructure including non-conductive charge trapping locations beneathmore than one of the plurality of gates in the series; circuitry toconduct source and drain bias voltages to the semiconductor body nearthe first gate and near the last gate in the series; and circuitry toconduct gate bias voltages to the plurality of gates; wherein thesemiconductor body includes a continuous, multiple-gate channel regionbeneath the plurality of gates in the series, the multiple-gate channelregion having one of n-type and p-type conductivity; and a controllerwhich controls the circuit to conduct source and drain bias voltages andthe circuitry to conduct gate bias voltages for storing data in chargetrapping locations beneath each of said more than one of the pluralityof gates in the series, the controller being arranged to control aprogram procedure, an erase procedure and a read procedure for thestorage locations beneath each of said more than one of the plurality ofgates in the series, and wherein the erase procedure includes erasing astorage location beneath a selected gate in the series in themultiple-gate memory cell, while not erasing a storage location beneathanother gate in the series, wherein the series of gates includes morethan two gates, and the charge storage structure includes chargetrapping locations beneath more than two gates in the series of gates.10. An integrated circuit memory device, comprising: a semiconductorbody; a plurality of word lines extending across the semiconductor body;a plurality of bit lines arranged generally orthogonally to theplurality of word lines across the semiconductor body; decodingcircuitry on the semiconductor body, and coupled to the plurality ofword lines and the plurality of bit lines; an array of multiple-gatestorage elements coupled to the plurality of word lines and theplurality of bit lines, the multiple-gate storage elements respectivelyincluding: a plurality of gates arranged in a series and coupled torespective word lines in the plurality of word lines, the plurality ofgates including a first gate in the series and a last gate in theseries, with insulating members isolating gates in the series fromadjacent gates in the series; a charge storage structure on thesemiconductor body, the charge storage structure includingnon-conductive charge trapping locations beneath more than one of theplurality of gates in the series; a continuous, multiple-gate channelregion beneath the plurality of gates in the series, the multiple-gatechannel region having one of n-type and p-type conductivity; and sourceand drain terminals near the first and last gates in the series, atleast one of the source and drain terminals being coupled to a bit linein the plurality of bit lines; and a controller which controls theplurality of word lines and the plurality of bit lines to conduct sourceand drain bias voltages and gate bias voltages for storing data incharge trapping locations beneath each of said more than one of theplurality of gates in the series, the controller being arranged tocontrol a program procedure, an erase procedure and a read procedure forthe storage locations beneath each of said more than one of theplurality of gates in the series, and wherein the erase procedureincludes erasing a storage location beneath a selected gate in theseries in the multiple-gate memory cell, while not erasing a storagelocation beneath another gate in the series.
 11. The device of claim 10,including charge trapping locations beneath all the gates in the series.12. The device of claim 10, wherein the erase procedure includesinducing hole injection current into the charge trapping locationbeneath the selected gate in the series.
 13. The device of claim 10,wherein the erase procedure includes inducing hole injection currentinto the charge trapping location beneath the selected gate in theseries, while not erasing a storage location beneath another gate in theseries, and the program procedure includes inducing electron injectioncurrent into the charge trapping location beneath a selected gate in theseries, while not programming a storage location beneath another gate inthe series.
 14. The device of claim 10, wherein the erase procedureincludes inducing hot hole injection current by band-to-band tunnelinginduced hot hole injection from the substrate to the charge storagestructure beneath the selected gate on one or both of source and drainsides of a region beneath the selected gate.
 15. The device of claim 10,wherein the charge storage structure comprises a dielectric stackincluding a bottom dielectric layer, a charge trapping dielectric layerand a top dielectric layer.
 16. The device of claim 10, wherein thecharge storage structure comprises a dielectric stack including a bottomdielectric layer, a charge trapping dielectric layer and a topdielectric layer, and wherein the charge trapping dielectric layercomprises silicon nitride.
 17. An integrated circuit memory device,comprising: a semiconductor body; a plurality of word lines extendingacross the semiconductor body; a plurality of bit lines arrangedgenerally orthogonally to the plurality of word lines across thesemiconductor body; decoding circuitry on the semiconductor body, andcoupled to the plurality of word lines and the plurality of bit lines;an array of multiple-gate storage elements coupled to the plurality ofword lines and the plurality of bit lines, the multiple-gate storageelements respectively including: a plurality of gates arranged in aseries and coupled to respective word lines in the plurality of wordlines, the plurality of gates including a first gate in the series and alast gate in the series, with insulating members isolating gates in theseries from adjacent gates in the series; a charge storage structure onthe semiconductor body the charge storage structure includingnon-conductive charge trapping locations beneath more than one of theplurality of gates in the series; a continuous multiple-gate channelregion beneath the plurality of gates in the series, the multiple-gatechannel region having one of n-type and p-type conductivity; and sourceand drain terminals near the first and last gates in the series at leastone of the source and drain terminals being coupled to a bit line in theplurality of bit lines; and a controller which controls the plurality ofword lines and the plurality of bit lines to conduct source and drainbias voltages and gate bias voltages for storing data in charge trappinglocations beneath each of said more than one of the plurality of gatesin the series the controller being arranged to control a programprocedure, an erase procedure and a read procedure for the storagelocations beneath each of said more than one of the plurality of gatesin the series, and wherein the erase procedure includes erasing astorage location beneath a selected gate in the series in themultiple-gate memory cell, while not erasing a storage location beneathanother gate in the series, wherein the series of gates includes morethan two gates, and the charge storage structure includes chargetrapping locations beneath more than two gates in the series of gates.18. A method for operating an integrated circuit memory device, thedevice comprising, a semiconductor body, a plurality of gates arrangedin series on the semiconductor body, the plurality of gates including afirst gate in the series and a last gate in the series, with insulatingmembers isolating gates in the series from adjacent gates in the series,a charge storage structure on the semiconductor body, the charge storagestructure including non-conductive charge trapping locations beneathmore than one of the plurality of gates in the series, wherein thesemiconductor body includes a continuous, multiple-gate channel regionbeneath the plurality of gates in the series, the multiple-gate channelregion having one of n-type and p-type conductivity; the methodcomprising applying a bias arrangement for programming data at aselected gate, the bias arrangement for erasing including: applying asubstrate bias condition to the semiconductor body in the multiple-gatechannel region; applying a source bias condition to the semiconductorbody near one of the first and last gates in the series; applying adrain bias condition to the semiconductor body near another of the firstand last gates in the series; and applying gate bias conditions forerase to the plurality of gates in the series, wherein the gate biasconditions include voltages sufficient to induce electron ejection from,or hole injection to, the charge trapping locations beneath a selectedgate in the series and inversion voltages on other gates in the seriessufficient to induce inversion in the multiple-gate channel regionbeneath said other gates, to establish the low threshold state in theselected gate; and the biasing arrangement for programming including:applying a substrate bias condition to the semiconductor body in themultiple-gate channel region; applying a source bias condition to thesemiconductor body near one of the first and last gates in the series;applying a drain bias condition to the semiconductor body near anotherof the first and last gates in the series; and applying gate biasconditions for program to the plurality of gates in the series, whereinthe gate bias conditions include a program voltage relative to thesubstrate bias condition on a selected gate in the series sufficient toinduce electron injection current into a charge trapping locationbeneath the selected gate to establish a high threshold state, andinversion voltages on other gates in the series sufficient to induceinversion in the multiple-gate channel region beneath said other gateswithout significant electron injection into charge storage locationsbeneath said other gates.
 19. The method of claim 18, further comprisingapplying a bias arrangement for reading including: applying a substratebias condition to the semiconductor body in the multiple-gate channelregion; applying a source bias condition to the semiconductor body nearone of the first and last gates in the series; applying a drain biascondition to the semiconductor body near another of the first and lastgate in the series; and applying gate bias conditions to the pluralityof gates in the series, wherein the gate bias conditions include a readvoltage relative to the substrate bias condition on a selected gate inthe series, the read voltage being higher than a threshold voltage forthe low threshold state, and inversion voltages on other gates in theseries sufficient to induce inversion in the multiple-gate channelregion beneath said other gates, the inversion voltages higher than thehigh threshold state.
 20. The method of claim 18, the erase procedureincluding: identifying a set of gates in the plurality of gates in theseries to be erased, the set of gates having more than one member;applying said gate bias conditions for erase for a first selected gatein the set of gates to induce one or both of source side and drain sideband-to-band tunneling induced hot hole injection to the charge storagelocation beneath the first selected gate; and applying said gate biasconditions for erase for a next selected gate in the set of gates toinduce one or both of source side and drain side band-to-band tunnelinginduced hot hole injection to the charge storage location beneath thenext selected gate, and repeating until applying said gate biasconditions for erase to all the gates in the set.